Title :
Oppositely polarised pulse shapes on CPS lines measured by scanning force optoelectronic microscope
Author :
Kasahara, Y. ; Mizuno, K.
Author_Institution :
Agilent Technol. Japan, Kawasaki, Japan
fDate :
10/11/2001 12:00:00 AM
Abstract :
Oppositely polarised picosecond electric pulses on each line of coplanar strips were measured using a scanning force optoelectronic microscope (SFOEM), developed by the authors. Results demonstrate that the SFOEM is a useful tool not only for measuring ultrafast voltage but also for analysing the operation of ultrafast large-scale integration devices
Keywords :
atomic force microscopy; high-speed optical techniques; measurement by laser beam; strip lines; voltage measurement; CPS lines; coplanar strips; oppositely polarised pulse shapes; picosecond electric pulses; scanning force optoelectronic microscope; ultrafast large-scale integration devices; ultrafast voltage measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20010882
