Title :
Analysis of nonlinear phenomena in MOV connected transformer
Author :
Al-Anbarri, K. ; Ramanujam, R. ; Keerthiga, T. ; Kuppusamy, K.
Author_Institution :
Sch. of Electr. & Electron. Eng., Anna Univ., Chennai, India
fDate :
11/1/2001 12:00:00 AM
Abstract :
This paper investigates the effect of a metal oxide arrester on the ferroresonance behaviour of a transformer connected in parallel. It is known that the arresters may in some cases cause ferroresonance ´dropout´. This aspect is examined in detail here by proper modelling of the nonlinear characteristics such as arrester characteristics and transformer saturation. Time-domain simulation has been carried out using a fourth-order Runge-Kutta method and the results were corroborated using EMTP. The results reveal that the presence of the arrester has a mitigating effect on ferroresonant overvoltages. Extensive simulations have been carried out to analyse the sensitivity with respect to arrester parameters, transformer saturation characteristics and the amplitude of the voltage source occurring in the Thevenin equivalent of the circuit. The presence of the arrester has a significant effect on the onset of chaos, the range of parameter values for which chaos persists and the magnitude of ferroresonant overvoltages
Keywords :
Runge-Kutta methods; arresters; chaos; equivalent circuits; ferroresonance; overvoltage protection; power transformers; sensitivity analysis; time-domain analysis; varistors; EMTP; MOV connected transformer; Thevenin equivalent circuit; arrester characteristics; arrester parameters; chaos; ferroresonance behaviour; ferroresonance dropout; ferroresonant overvoltages magnitude; ferroresonant overvoltages mitigation; fourth-order Runge-Kutta method; metal oxide arrester; metal oxide varistors; nonlinear phenomena analysis; parallel connected transformer; parameter values; sensitivity analysis; time-domain simulation; transformer saturation; transformer saturation characteristics; voltage source amplitude;
Journal_Title :
Generation, Transmission and Distribution, IEE Proceedings-
DOI :
10.1049/ip-gtd:20010571