• DocumentCode
    1551578
  • Title

    An Electronic Synapse Device Based on Metal Oxide Resistive Switching Memory for Neuromorphic Computation

  • Author

    Yu, Shimeng ; Wu, Yi ; Jeyasingh, Rakesh ; Kuzum, Duygu ; Wong, H. -S Philip

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • Volume
    58
  • Issue
    8
  • fYear
    2011
  • Firstpage
    2729
  • Lastpage
    2737
  • Abstract
    The multilevel capability of metal oxide resistive switching memory was explored for the potential use as a single-element electronic synapse device. TiN/HfOx/AlOx/ Pt resistive switching cells were fabricated. Multilevel resistance states were obtained by varying the programming voltage amplitudes during the pulse cycling. The cell conductance could be continuously increased or decreased from cycle to cycle, and about 105 endurance cycles were obtained. Nominal energy consumption per operation is in the subpicojoule range with a maximum measured value of 6 pJ. This low energy consumption is attractive for the large-scale hardware implementation of neuromorphic computing and brain simulation. The property of gradual resistance change by pulse amplitudes was exploited to demonstrate the spike-timing-dependent plasticity learning rule, suggesting that metal oxide memory can potentially be used as an electronic synapse device for the emerging neuromorphic computation system.
  • Keywords
    CMOS integrated circuits; brain models; neural nets; brain simulation; cell conductance; metal oxide resistive switching memory; multilevel resistance states; neuromorphic computation system; neuromorphic computing; nominal energy consumption; programming voltage amplitudes; pulse amplitudes; pulse cycling; resistive switching cells; single-element electronic synapse device; spike-timing-dependent plasticity learning rule; subpicojoule range; Energy consumption; Immune system; Metals; Neurons; Resistance; Switches; Bio-inspired system; neuromorphic computation; resistive switching memory; spike-timing-dependent plasticity (STDP); synapse;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2147791
  • Filename
    5872020