Title :
Dielectric surface flashover in vacuum at 100 K
Author :
Neuber, A. ; Butcher, M. ; Hatfield, L.L. ; Kristiansen, M. ; Krompholz, H.
Author_Institution :
Dept. of Electr. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
fDate :
8/1/1999 12:00:00 AM
Abstract :
Cryogenic components in high power electrical systems and in power electronics gain more and more importance. The behavior of insulators for cryogenic conditions, however, is virtually unknown. In a fast coaxial setup, dielectric test sample and electrodes in vacuum are cooled to <100 K and flashover is characterized using fast electrical and optical diagnostics. Three consecutive development stages for flashover in self-breakdown mode with a gap distance of 0.5 cm can be distinguished: (1) a fast current rise to mA amplitudes within ~2 ns, probably associated with field emission, followed by, (2) a slow current rise to ~5 to 10 A amplitude with duration of 40 ns to 1 μs, associated with secondary emission avalanche saturation, and (3) a transition to a rapid gaseous ionization above the sample caused by electron induced outgassing, leading to impedance-limited current amplitudes of ⩽300 A. Phase (1) shows a higher final current at lower temperature, which is probably due to a higher initial velocity of the secondary electrons, the duration of phase (2) is a decreasing function of breakdown voltage and only slightly dependent on temperature, which points to a weak temperature dependence of the outgassing process. Flashover potentials show a slight increase at lower temperature
Keywords :
cryogenic electronics; dielectric properties; flashover; ionisation; secondary electron emission; vacuum breakdown; 0.5 cm; 100 K; 40 ns to 1 mus; 5 to 10 A; breakdown voltage; cryogenic components; cryogenic conditions; dielectric surface flashover; dielectric test sample; electrical diagnostics; electron induced outgassing; fast coaxial setup; fast current rise; field emission; flashover potentials; gap distance; high power electrical systems; impedance-limited current amplitudes; optical diagnostics; power electronics; rapid gaseous ionization; secondary electrons; secondary emission avalanche saturation; self-breakdown mode; slow current rise; vacuum; Coaxial components; Cryogenics; Dielectrics and electrical insulation; Electron emission; Flashover; Power electronics; Temperature dependence; Temperature distribution; Testing; Vacuum systems;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on