DocumentCode
1551579
Title
Dielectric surface flashover in vacuum at 100 K
Author
Neuber, A. ; Butcher, M. ; Hatfield, L.L. ; Kristiansen, M. ; Krompholz, H.
Author_Institution
Dept. of Electr. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
Volume
6
Issue
4
fYear
1999
fDate
8/1/1999 12:00:00 AM
Firstpage
512
Lastpage
515
Abstract
Cryogenic components in high power electrical systems and in power electronics gain more and more importance. The behavior of insulators for cryogenic conditions, however, is virtually unknown. In a fast coaxial setup, dielectric test sample and electrodes in vacuum are cooled to <100 K and flashover is characterized using fast electrical and optical diagnostics. Three consecutive development stages for flashover in self-breakdown mode with a gap distance of 0.5 cm can be distinguished: (1) a fast current rise to mA amplitudes within ~2 ns, probably associated with field emission, followed by, (2) a slow current rise to ~5 to 10 A amplitude with duration of 40 ns to 1 μs, associated with secondary emission avalanche saturation, and (3) a transition to a rapid gaseous ionization above the sample caused by electron induced outgassing, leading to impedance-limited current amplitudes of ⩽300 A. Phase (1) shows a higher final current at lower temperature, which is probably due to a higher initial velocity of the secondary electrons, the duration of phase (2) is a decreasing function of breakdown voltage and only slightly dependent on temperature, which points to a weak temperature dependence of the outgassing process. Flashover potentials show a slight increase at lower temperature
Keywords
cryogenic electronics; dielectric properties; flashover; ionisation; secondary electron emission; vacuum breakdown; 0.5 cm; 100 K; 40 ns to 1 mus; 5 to 10 A; breakdown voltage; cryogenic components; cryogenic conditions; dielectric surface flashover; dielectric test sample; electrical diagnostics; electron induced outgassing; fast coaxial setup; fast current rise; field emission; flashover potentials; gap distance; high power electrical systems; impedance-limited current amplitudes; optical diagnostics; power electronics; rapid gaseous ionization; secondary electrons; secondary emission avalanche saturation; self-breakdown mode; slow current rise; vacuum; Coaxial components; Cryogenics; Dielectrics and electrical insulation; Electron emission; Flashover; Power electronics; Temperature dependence; Temperature distribution; Testing; Vacuum systems;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/94.788752
Filename
788752
Link To Document