DocumentCode
1552093
Title
A Microionizer for Portable Mass Spectrometers Using Double-Gated Isolated Vertically Aligned Carbon Nanofiber Arrays
Author
Chen, Liang-Yu ; Velásquez-García, Luis Fernando ; Wang, Xiazhi ; Teo, K. ; Akinwande, Akintunde Ibitayo
Author_Institution
Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
58
Issue
7
fYear
2011
fDate
7/1/2011 12:00:00 AM
Firstpage
2149
Lastpage
2158
Abstract
We report a gas ionizer based on arrays of microfabricated double-gated isolated vertically aligned carbon nanofibers (VA-CNFs) for application in low-power portable mass spectrometers. Field-emitted electrons from VA-CNFs are accelerated to high energy and subsequently collide with neutral gas molecules, leading to ionization/fragmentation of the molecules. Double-gated field-emitter arrays with isolated VA-CNF tips were fabricated using a photoresist planarization technique. Two types of devices were fabricated and characterized. The first type of device has the emitter tip in the same plane as the extraction gate, and the second type of device has the emitter tip 900 nm below the extraction gate. All devices were made using a process that results in gate and focus diameters of 1.7 and 4.2 μm, respectively. When operated as a field-emitted electron impact ionizer (EII), for the same ion current, the ionization efficiency (ratio of ions to emitted electrons) increased from 0.005 to 0.05 as the pressure is increased between 5×10-6 and 1×10-3 torr. In comparison with EIIs based on thermionic electron sources, the power dissipation reduced from >;1 W to 100 mW.
Keywords
carbon; mass spectrometers; microfabrication; nanofibres; thermionic electron emission; C; double gated isolated vertically aligned carbon nanofiber arrays; field emitted electron impact ionizer; field emitted electrons; gas ionizer; low power portable mass spectrometer; microfabricated double gated isolated vertically aligned carbon nanofibers; microionizer; neutral gas molecule; thermionic electron source; Anodes; Apertures; Ions; Logic gates; Mathematical model; Nickel; Ionization; vacuum technology;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2011.2145419
Filename
5873138
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