DocumentCode :
1552093
Title :
A Microionizer for Portable Mass Spectrometers Using Double-Gated Isolated Vertically Aligned Carbon Nanofiber Arrays
Author :
Chen, Liang-Yu ; Velásquez-García, Luis Fernando ; Wang, Xiazhi ; Teo, K. ; Akinwande, Akintunde Ibitayo
Author_Institution :
Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume :
58
Issue :
7
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
2149
Lastpage :
2158
Abstract :
We report a gas ionizer based on arrays of microfabricated double-gated isolated vertically aligned carbon nanofibers (VA-CNFs) for application in low-power portable mass spectrometers. Field-emitted electrons from VA-CNFs are accelerated to high energy and subsequently collide with neutral gas molecules, leading to ionization/fragmentation of the molecules. Double-gated field-emitter arrays with isolated VA-CNF tips were fabricated using a photoresist planarization technique. Two types of devices were fabricated and characterized. The first type of device has the emitter tip in the same plane as the extraction gate, and the second type of device has the emitter tip 900 nm below the extraction gate. All devices were made using a process that results in gate and focus diameters of 1.7 and 4.2 μm, respectively. When operated as a field-emitted electron impact ionizer (EII), for the same ion current, the ionization efficiency (ratio of ions to emitted electrons) increased from 0.005 to 0.05 as the pressure is increased between 5×10-6 and 1×10-3 torr. In comparison with EIIs based on thermionic electron sources, the power dissipation reduced from >;1 W to 100 mW.
Keywords :
carbon; mass spectrometers; microfabrication; nanofibres; thermionic electron emission; C; double gated isolated vertically aligned carbon nanofiber arrays; field emitted electron impact ionizer; field emitted electrons; gas ionizer; low power portable mass spectrometer; microfabricated double gated isolated vertically aligned carbon nanofibers; microionizer; neutral gas molecule; thermionic electron source; Anodes; Apertures; Ions; Logic gates; Mathematical model; Nickel; Ionization; vacuum technology;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2145419
Filename :
5873138
Link To Document :
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