• DocumentCode
    1552536
  • Title

    Crosstalk-, loss-, and length-reduced digital optical Y-branch switches using a double-etch waveguide structure

  • Author

    Khan, M.N. ; Miller, B.I. ; Burrows, E.C. ; Burrus, C.A.

  • Author_Institution
    Lucent Technol., AT&T Bell Labs., Holmdel, NJ, USA
  • Volume
    11
  • Issue
    10
  • fYear
    1999
  • Firstpage
    1250
  • Lastpage
    1252
  • Abstract
    We demonstrate a novel Y-branch digital switch with a double-etch waveguide structure to greatly enhance the loss and crosstalk performance. The double-etch design increases the coupling between the two tapered Y-branch waveguides, which allows for efficient switching while decreasing the radiation loss that arises from the branching angle. This combined advantage also allows us to reduce the switch length, which in turn results in an efficient high-speed design. The measured crosstalk and loss are -19 and 3 dB, respectively, for a 3-mm-long switch. Further crosstalk reduction is expected from the simulation of a more optimized design.
  • Keywords
    III-V semiconductors; electro-optical switches; etching; gallium arsenide; gallium compounds; indium compounds; integrated optics; optical crosstalk; optical design techniques; optical fabrication; optical losses; optical waveguides; optimisation; semiconductor quantum wells; -19 dB; 3 dB; 3 mm; InGaAsP; branching angle; crosstalk performance; crosstalk reduction; crosstalk-reduced digital optical Y-branch switches; double-etch design; double-etch waveguide structure; high-speed design; length-reduced digital optical Y-branch switches; loss-reduced digital optical Y-branch switches; measured crosstalk; optimized design; radiation loss; switch length; tapered Y-branch waveguides; Etching; High speed optical techniques; Optical crosstalk; Optical losses; Optical refraction; Optical sensors; Optical switches; Optical variables control; Optical waveguides; Semiconductor waveguides;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.789707
  • Filename
    789707