• DocumentCode
    1553334
  • Title

    Monolithic dual-detector for photon-correlation spectroscopy with wide dynamic range and optical 70-ps resolution

  • Author

    Ghioni, Massimo ; Cova, Sergio ; Rech, Ivan ; Zappa, Franco

  • Author_Institution
    Dept. of Electron. e Inf., Politecnico di Milano, Milan, Italy
  • Volume
    37
  • Issue
    12
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    1588
  • Lastpage
    1593
  • Abstract
    A monolithic integrated dual-detector for photon correlation analysis has been designed and tested. The basic element is a single photon avalanche diode (SPAD) with intrinsic low noise- and high time-resolution. Wafer type and fabrication processes, compatible with the planar technology of silicon-integrated circuits, ensure low fabrication cost and high yield in the fabrication of dual-detectors suitable for miniaturized, versatile, and fast photon-correlation instruments for the visible and the near-infrared spectral range. Dynamic range of four decades and time resolution better than 70-ps FWHM are routinely attained in measurements of correlation functions
  • Keywords
    avalanche photodiodes; infrared detectors; infrared spectroscopy; integrated optics; optical crosstalk; optical design techniques; optical fabrication; optical noise; optical resolving power; optical testing; photodetectors; photon correlation spectroscopy; photon counting; visible spectroscopy; 70 ps; FWHM; SPAD; Si-integrated circuits; correlation functions; design; dual-detectors; dynamic range; fabrication cost; fabrication process; fast photon-correlation instruments; high time-resolution; intrinsic low noise-resolution; monolithic dual-detector; monolithic integrated dual-detector; near-infrared spectral range; photon correlation analysis; photon-correlation spectroscopy; planar technology; resolution; single photon avalanche diode; testing; time resolution; visible spectral range; wafer type process; wide dynamic range; yield; Circuit testing; Costs; Diodes; Dynamic range; Fabrication; Instruments; Integrated circuit technology; Integrated circuit yield; Photonics; Spectroscopy;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.970905
  • Filename
    970905