An extrinsic-inductance independent approach for direct extraction of HBT intrinsic circuit parameters

Author

Horng, Tzyy-Sheng ; Wu, Jian-Ming ; Huang, Hui-Hsiang

Author_Institution

Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan

Volume

49

Issue

12

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

2300

Lastpage

2305

Abstract

A novel analytical procedure has been proposed for direct extraction of the intrinsic elements in a hybrid-π equivalent circuit of heterojunction bipolar transistors. This method differs from previous ones by formulating impedance-parameter based expressions that are exclusive of the extrinsic inductances associated with the base, emitter, and collector. It is therefore not susceptible to variation of the extrinsic reactances from DC to high frequencies and can lead to very accurate extraction of the intrinsic elements under different bias conditions. The distributed phenomena in the base region can be also characterized rigorously by exploiting the bias-independent features of the extrinsic elements that are extracted subsequently from knowledge of the intrinsic elements

Keywords

electric impedance; electric reactance; equivalent circuits; heterojunction bipolar transistors; microwave bipolar transistors; network parameters; semiconductor device measurement; semiconductor device models; analytical procedure; base; base region; bias conditions; bias-independent features; collector; direct HBT intrinsic circuit parameter extraction; distributed phenomena; emitter; extrinsic elements; extrinsic inductances; extrinsic reactances; extrinsic-inductance independent approach; heterojunction bipolar transistors; hybrid-π equivalent circuit; hybrid-pi equivalent circuit; impedance-parameter based expressions; intrinsic elements; parameter extraction; semiconductor device modeling; Bipolar transistors; Current measurement; Equivalent circuits; Frequency; Heterojunction bipolar transistors; Impedance; Integrated circuit interconnections; Millimeter wave measurements; Parameter extraction; Testing;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.971613

Filename

971613