• DocumentCode
    1553725
  • Title

    Optimization of 40-nm Node Epitaxial Diode Array for Phase-Change Memory Application

  • Author

    Liu, Yan ; Song, Zhitang ; Liu, Bo ; Wu, Guanping ; Chen, Houpeng ; Zhang, Chao ; Wang, Lianhong ; Feng, Songlin

  • Author_Institution
    State Key Lab. of Functional Mater. for Inf., Shanghai Inst. of Microsyst. & Inf. Technol., Shanghai, China
  • Volume
    33
  • Issue
    8
  • fYear
    2012
  • Firstpage
    1192
  • Lastpage
    1194
  • Abstract
    A numerical model of an epitaxial (EPI) diode array for next-generation memory device application, including phase-change memory, has been presented. According to a diode array process scheme and technology computer-aided design (TCAD) simulation results, a quasi-physical model with a buried n+ layer dosage, EPI layer thickness, and breakdown voltage (BVD) correlation is proposed to improve electrical performance. From the optimal silicon-based results, a 16×16 diode array shows a drive current density of ~56.6 mA/μm2, a BVD of ~8 V, a Jon/Joff ratio of ~109, and crosstalk immunity. Additionally, this calibrated physical model can be applied in the next generation of silicon-based fabrication with parameters extraction.
  • Keywords
    electric breakdown; elemental semiconductors; numerical analysis; phase change memories; silicon; technology CAD (electronics); BVD; EPI layer thickness; Si; TCAD simulation; breakdown voltage correlation; buried n+ layer dosage; crosstalk immunity; electrical performance improvement; epitaxial diode array; next-generation memory device application; numerical model; parameters extraction; phase-change memory application; quasiphysical model; silicon-based fabrication; size 40 nm; technology computer-aided design simulation; Arrays; Doping; Numerical models; Phase change materials; Phase change memory; Resistance; Silicon; Buried $hbox{n}^{+}$ layer (BNL) series resistance; epitaxial (EPI) diode array; numerical model; phase-change memory (PCM);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2199733
  • Filename
    6232434