DocumentCode :
1553739
Title :
Clarification of the Change in the Extinction Characteristics of an InP-Based Mach–Zehnder Modulator
Author :
Mawatari, Hiroyasu ; Ishikawa, Mitsuteru ; Yasui, Takako ; Shibata, Yasuo ; Yamada, Eiichi ; Kikuchi, Nobuhiro ; Ishii, Hiroyuki
Author_Institution :
NTT Photonics Labs., NTT Corp., Atsugi, Japan
Volume :
24
Issue :
16
fYear :
2012
Firstpage :
1450
Lastpage :
1452
Abstract :
The stability of the extinction characteristics of an InP-based Mach-Zehnder modulator is clarified in detail. The changes in the half-wavelength voltage (Vπ) and null point voltage (Vnull) are investigated under long-term high-temperature aging tests. The time correlations with the change in Vπ and Vnull are different from each other. By using a statistical treatment of the Weibull distribution, the degradation modes of the changes in Vπ and Vnull are clarified as a wear-out failure and an early failure, respectively.
Keywords :
III-V semiconductors; Weibull distribution; indium compounds; optical modulation; InP; Mach-Zehnder modulator; Weibull distribution; extinction characteristics stability; long-term high-temperature aging tests; Aging; Degradation; Electrodes; Mach-Zehnder interferometers; Modulation; Testing; Weibull distribution; Failure analysis; Weibull distribution; optical modulation; semiconductor device reliability;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2012.2207101
Filename :
6232437
Link To Document :
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