Title :
Clarification of the Change in the Extinction Characteristics of an InP-Based Mach–Zehnder Modulator
Author :
Mawatari, Hiroyasu ; Ishikawa, Mitsuteru ; Yasui, Takako ; Shibata, Yasuo ; Yamada, Eiichi ; Kikuchi, Nobuhiro ; Ishii, Hiroyuki
Author_Institution :
NTT Photonics Labs., NTT Corp., Atsugi, Japan
Abstract :
The stability of the extinction characteristics of an InP-based Mach-Zehnder modulator is clarified in detail. The changes in the half-wavelength voltage (Vπ) and null point voltage (Vnull) are investigated under long-term high-temperature aging tests. The time correlations with the change in Vπ and Vnull are different from each other. By using a statistical treatment of the Weibull distribution, the degradation modes of the changes in Vπ and Vnull are clarified as a wear-out failure and an early failure, respectively.
Keywords :
III-V semiconductors; Weibull distribution; indium compounds; optical modulation; InP; Mach-Zehnder modulator; Weibull distribution; extinction characteristics stability; long-term high-temperature aging tests; Aging; Degradation; Electrodes; Mach-Zehnder interferometers; Modulation; Testing; Weibull distribution; Failure analysis; Weibull distribution; optical modulation; semiconductor device reliability;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2012.2207101
