Title :
Simplified method for measurements and calculations of coupling coefficients and Q0 factor of high-temperature superconducting dielectric resonators
Author :
Jacob, Mohan V. ; Mazierska, Janina ; Leong, Kenneth ; Krupka, Jerzy
Author_Institution :
Dept. of Electr. & Comput. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia
fDate :
12/1/2001 12:00:00 AM
Abstract :
To accurately determine the surface resistance of high-temperature superconducting films, multifrequency measurements of S21, S 11, and S22 and sophisticated data processing are required. As a result, surface resistance measurements and calculations for varying temperatures are very time consuming. In this paper, we introduce a simplified method for calculations of the unloaded Q (Q0) factor, which require measurements of S11 and S22 at the lowest temperature only. For all other temperatures, only S21 measurements are needed. The method has been shown to give sufficiently accurate Q0 values and, hence, the surface resistance of superconducting samples, as compared to results obtained from S21, S11, and S22 measurements using the transmission-mode Q factor technique. The presented method has been tested under different coupling coefficients and frequencies
Keywords :
Q-factor; S-parameters; cryogenic electronics; dielectric resonators; high-temperature superconductors; microwave measurement; superconducting microwave devices; superconducting resonators; superconducting thin films; Q0 factor; S-parameters; coupling coefficients; high-temperature superconducting dielectric resonators; high-temperature superconducting films; multifrequency measurements; surface resistance; transmission-mode technique; unloaded Q; Couplings; Data processing; Electrical resistance measurement; Frequency; High temperature superconductors; Q factor; Q measurement; Superconducting films; Surface resistance; Testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
