DocumentCode :
1553812
Title :
Impact of the Variability of the Process Parameters on CNT-Based Nanointerconnects Performances: A Comparison Between SWCNTs Bundles and MWCNT
Author :
Lamberti, Patrizia ; Tucci, Vincenzo
Author_Institution :
Dept. of Electron. & Comput. Eng., Univ. of Salerno, Fisciano, Italy
Volume :
11
Issue :
5
fYear :
2012
Firstpage :
924
Lastpage :
933
Abstract :
A reliable estimation of the performances of two possible realizations of a CNT-based nano-interconnect, namely one obtained by using a bundle of SWCNT and another one employing an MWCNT, taking into account the variations of some physical and geometrical characteristics is carried out. The ranges of the per unit length parameters of a transmission line modeling the interconnect and those of the propagation time delay are analyzed for three different technologies (15, 21, and 32 nm) by means of interval analysis. This approach provides, at once, a worst case analysis and a sound assessment of the robustness and accuracy of the considered performance as a function of the interconnect length. A comparison of the two technological alternatives is carried out in a more consistent way than that usually achieved by considering the nominal behavior.
Keywords :
carbon nanotubes; delays; embedded systems; interconnections; nanoelectronics; transmission lines; CNT-based nanointerconnects performances; MWCNT; SWCNT bundles; geometrical characteristics; interconnect length; interval analysis; physical characteristics; process parameters variability; propagation time delay; reliable estimation; sound assessment; transmission line modeling; worst case analysis; Delay effects; Integrated circuit interconnections; Integrated circuit modeling; Permittivity; Quantum capacitance; Uncertainty; Carbon nanotubes (CNT); interconnects; reliability;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2012.2207124
Filename :
6232459
Link To Document :
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