DocumentCode :
1553996
Title :
Phrase correction by laser ablation of a polarization independent LiNbO3 Mach-Zehnder modulator
Author :
Chen, Chii-Chang ; Forte, H. ; Carenco, Alain ; Goedgebuer, Jean-Pierre ; Armbruster, Vincent
Author_Institution :
Lab. d´´Opt., Univ. de Franche-Comte, Besancon, France
Volume :
9
Issue :
10
fYear :
1997
Firstpage :
1361
Lastpage :
1363
Abstract :
We report the results obtained using a phase correction process of the TE- and TM-electrooptic responses of a Mach-Zehnder modulator integrated in a Z-propagation lithium niobate crystal. Phase correction is achieved by UV laser ablation. This ablation process allows the phase defects that can occur during the fabrication of the modulator to be cancelled out, in order to get a perfectly polarization-independent behavior.
Keywords :
Mach-Zehnder interferometers; electro-optical modulation; integrated optics; laser ablation; light polarisation; lithium compounds; optical fabrication; LiNbO/sub 3/; TE-electrooptic response; TM-electrooptic response; UV laser ablation; Z-propagation lithium niobate crystal; fabrication; laser ablation; perfectly polarization-independent behavior; phase correction; phase defects; polarization independent LiNbO/sub 3/ Mach-Zehnder modulator; Electrooptic modulators; Laser ablation; Optical device fabrication; Optical modulation; Optical polarization; Optical refraction; Optical variables control; Optical waveguides; Phase modulation; Refractive index;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.623263
Filename :
623263
Link To Document :
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