Title :
Tracking performance and robustness analysis of Hurst estimators for multifractional processes
Author :
Sheng, Hao ; Chen, Y.Q. ; Qiu, T.S.
Author_Institution :
Sch. of Electr. & Inf., Dalian Jiaotong Univ., Dalian, China
fDate :
5/1/2012 12:00:00 AM
Abstract :
In this study, the authors focus on the tracking performance and the robustness of 12 sliding-windowed Hurst estimators for multifractional processes with linear trend local Hölder exponent, noisy multifractional processes and multifractional processes with infinite second-order statistics. Four types of multifractional processes are synthesised to test the tracking performance and robustness of these 12 sliding-windowed Hurst estimators. They are (i) noise-free multifractional process; (ii) multifractional process corrupted by 30-dB signal-to-noise ratio (SNR) white Gaussian noise; (iii) multifractional process corrupted by 30-dB SNR impulse noise; and (iv) multifractional stable process, which has no finite second-order statistics. Furthermore, the standard error of different sliding-windowed Hurst estimators are calculated in order to quantify the accuracy and robustness. This study provides a guideline and principle in the selection of Hurst estimators for noise-free multifractional process, noise-corrupted multifractional process and multifractional process with infinite second-order statistics. The results of this analysis show that the sliding-windowed Kettani and Gubner̈s method provides the best-tracking performance for multifractional processes with linear trend local Hölder exponent and good robustness to noise.
Keywords :
Gaussian noise; estimation theory; impulse noise; signal processing; tracking; white noise; Gubners method; Hurst estimators; impulse noise; infinite second-order statistics; linear trend local Holder exponent; multifractional stable process; noisy multifractional processes; robustness analysis; sliding windowed Hurst estimator; sliding-windowed Kettani method; standard error; tracking performance; white Gaussian noise;
Journal_Title :
Signal Processing, IET
DOI :
10.1049/iet-spr.2010.0170