Title :
Reliable method for delay-fault diagnosis
Author :
Girard, P. ; Landrault, C. ; Pravossoudovitch, S.
Author_Institution :
Montpellier Univ. des Sci. et Tech. du Languedoc, France
Abstract :
The class of faults known as delay faults is investigated. The diagnosis process is performed after the detection of a circuit malfunction. Unfortunately, the existing methods for locating time failures on digital circuits have shown certain deficiencies. A new and perfectly reliable method for delay fault diagnosis, based on the symbolic simulation of the fault-free circuit, is presented.
Keywords :
delays; fault location; logic testing; circuit malfunction; delay-fault diagnosis; digital circuits; fault-free circuit; logic circuits; reliable method; symbolic simulation; time failures;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19911144
