Title :
A counting pixel chip and sensor system for X-ray imaging
Author :
Fischer, P. ; Hausmann, J. ; Helmich, A. ; Lindner, M. ; Wermes, N. ; Blanquart, L.
Author_Institution :
Phys. Inst., Bonn Univ., Germany
fDate :
8/1/1999 12:00:00 AM
Abstract :
Results obtained with a (photon) counting pixel imaging chip connected to a silicon pixel sensor using the bump and flip-chip technology are presented. The performance of the chip electronics is characterized by an average equivalent noise charge (ENC) below 135 e and a threshold spread of less than 35 e after individual threshold adjust, both measured with a sensor attached. First results on the imaging performance are also reported
Keywords :
X-ray detection; biomedical equipment; diagnostic radiography; Si; X-ray imaging; bump/flip-chip technology; chip electronics performance; counting pixel chip; equivalent noise charge; imaging performance; medical diagnostic imaging; medical instrumentation; sensor system; silicon pixel sensor; threshold spread; Charge measurement; Current measurement; Image sensors; Optical imaging; Optoelectronic and photonic sensors; Pixel; Sensor phenomena and characterization; Sensor systems; Silicon; X-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on
