A quadrature data-dependent DEM algorithm to improve image rejection of a complex ΣΔ modulator

Author

Breems, Lucien J. ; Dijkmans, Eise Carel ; Huijsing, Johan H.

Author_Institution

Philips Res. Lab., Eindhoven, Netherlands

Volume

36

Issue

12

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

1879

Lastpage

1886

Abstract

A dynamic element matching (DEM) algorithm is presented that is controlled by the quadrature output data of a complex sigma-delta modulator. This DEM technique is used to correct the gain and phase errors between the circuits in the in-phase and quadrature-phase feedback paths of the modulator. The key feature of this DEM technique is that it does not cause leakage of high-frequency quantization noise in the signal band, as encounters with the periodic or pseudorandom DEM techniques. No test signal is required to measure the gain and phase errors, and as the DEM circuit is operating continuously, it compensates for changes in, e.g., temperature and supply voltage. A 0.35-μm CMOS prototype chip has been designed to test the DEM circuit. A batch of 38 measured samples shows a typical mismatch-independent image rejection ratio of 63 dB with DEM

Keywords

CMOS integrated circuits; circuit feedback; integrated circuit noise; quantisation (signal); sigma-delta modulation; 0.35 micron; CMOS chip; analog-to-digital converter; dynamic element matching algorithm; gain error; image rejection; in-phase feedback; phase error; quadrature data; quadrature-phase feedback; quantization noise; sigma-delta modulator; Circuit noise; Circuit testing; Delta-sigma modulation; Error correction; Feedback circuits; Gain measurement; Phase measurement; Phase modulation; Quantization; Semiconductor device measurement;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.972138

Filename

972138