• DocumentCode
    1554814
  • Title

    Energy storage at 77 K in multilayer ceramic capacitors

  • Author

    Lawless, W.N. ; Clark, C.F., Jr.

  • Author_Institution
    CeramPhysics Inc., Westerville, OH, USA
  • Volume
    12
  • Issue
    5
  • fYear
    1997
  • fDate
    5/1/1997 12:00:00 AM
  • Firstpage
    32
  • Lastpage
    35
  • Abstract
    A ceramic material having a large dielectric constant at 77 K, /spl epsi/=8000-12000, has been developed for capacitive energy storage at this temperature. A large matrix of multilayer ceramic capacitors were fabricated using conventional tape-casting methods to optimize the dielectric breakdown strength at 77 K, and measured energy storage values on these capacitors range up to 6 J/cm3 at 77 K. An unfused bank of these capacitors was voltage-cycled 105 times at 77 K without failure, and the heating effects during cycling were immeasurably small (i.e., nitrogen boiloff was monitored). An electrocaloric effect on discharge (/spl Delta/T/spl sim/1 K) contributes to the thermal stability. Measurements of the frequency dependence of the dielectric properties of the ceramic at 77 K indicate a fundamental limit of about 8 μs for the switching repetition rate. Improved capacitor-manufacturing methods are discussed which can increase the energy density to the 20-30 J/cm3 range.
  • Keywords
    capacitor storage; ceramic capacitors; electric breakdown; electric strength; permittivity; thermal stability; 77 K; 8 mus; capacitive energy storage; dielectric breakdown strength; dielectric constant; electrocaloric effect; energy density; frequency dependence; heating effects; multilayer ceramic capacitors; switching repetition rate; tape-casting methods; thermal stability; unfused bank; Capacitors; Ceramics; Dielectric breakdown; Dielectric constant; Dielectric materials; Dielectric measurements; Energy storage; Nonhomogeneous media; Optimization methods; Temperature;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.587817
  • Filename
    587817