DocumentCode :
1555066
Title :
Sampled grating conventional DFB lasers with fabricability and high immunity to the spatial-hole burning
Author :
Kim, Sang-Bae ; Cho, Jong-Sup
Author_Institution :
Dept. of Electr. & Electron. Eng., Ajou Univ., Suwon, South Korea
Volume :
9
Issue :
5
fYear :
1997
fDate :
5/1/1997 12:00:00 AM
Firstpage :
560
Lastpage :
562
Abstract :
Sampled grating has been used to enlarge the allowed range of coupling coefficient for high spatial hole-burning corrected single-frequency yield in conventional index-coupled DFB lasers with 1%-80% mirror combination. Theoretical calculation using an effective-index transfer matrix method shows that the allowed range of coupling coefficient increases approximately by 20% in the proposed sampled grating distributed-feedback lasers (DFB) lasers compared with conventional ones. Thus, the tolerance to the coupling coefficient variation improves to the level typically achieved in grating fabrication. The improvement is attributed to the flattened axial photon distribution of gap modes, and therefore stability in other lasing characteristics can be expected.
Keywords :
diffraction gratings; distributed feedback lasers; laser mirrors; laser stability; optical couplers; optical fabrication; optical hole burning; optical transmitters; refractive index; semiconductor lasers; semiconductor technology; DFB lasers; coupling coefficient; coupling coefficient variation; effective-index transfer matrix method; flattened axial photon distribution; gap modes; grating fabrication; high immunity; high spatial hole-burning corrected single-frequency yield; index-coupled DFB lasers; lasing stability; mirror combination; sampled grating conventional DFB lasers; sampled grating distributed-feedback lasers; semiconductor lasers; spatial-hole burning; Chirp; Fiber lasers; Gratings; Laser modes; Laser theory; Mirrors; Optical coupling; Optical device fabrication; Optical transmitters; Semiconductor lasers;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.588095
Filename :
588095
Link To Document :
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