Title :
Monolithic integration of SEEDs and VLSI GaAs circuits by epitaxy on electronics
Author :
Wang, Hao ; Luo, Jiafu ; Shenoy, Krishna V. ; Royter, Yakov ; Fonstad, Clifton G., Jr. ; Psaltis, Demetri
Author_Institution :
Dept. of Mater. Sci. & Eng., MIT, Cambridge, MA, USA
fDate :
5/1/1997 12:00:00 AM
Abstract :
Using the epitaxy-on-electronics (EoE) process, self-electrooptic effect devices (SEEDs) have been monolithically integrated with VLSI GaAs electronics. The EoE approach provides both depletion-mode and enhancement-mode MESFETs for large-scale, high-density optoelectronic circuits. The performance of SEEDs grown by molecular beam epitaxy at a reduced temperature compatible with the EoE process is shown to be robust, and modulators with contrast ratios of 2.3:1 at 7.5-V bias have been integrated on commercially processed VLSI GaAs circuits. The EoE-SEED process offers potential improvements over the FET-SEED process, facilitating the applications of SEEDs in free-space optical switching and computing.
Keywords :
III-V semiconductors; MESFET integrated circuits; SEEDs; electro-optical modulation; electro-optical switches; epitaxial growth; gallium arsenide; integrated optoelectronics; optical computing; semiconductor growth; semiconductor quantum wells; semiconductor technology; 7.5 V; EoE process; FET-SEED process; GaAs; SEEDs; VLSI GaAs circuits; VLSI GaAs electronics; commercially processed VLSI GaAs circuits; contrast ratios; depletion-mode MESFETs; enhancement-mode MESFETs; epitaxy on electronics; epitaxy-on-electronics process; free-space optical switching; large-scale high-density optoelectronic circuits; molecular beam epitaxy; monolithic integration; monolithically integrated; optical computing; reduced temperature; self-electrooptic effect devices; Epitaxial growth; Gallium arsenide; Large-scale systems; MESFETs; Molecular beam epitaxial growth; Monolithic integrated circuits; Optical computing; Optical modulation; Temperature; Very large scale integration;
Journal_Title :
Photonics Technology Letters, IEEE