Pump-probe studies of carrier capture processes in semiconductor multiple-quantum-well waveguides

Author

Huang, Jian-Jang ; Huang, Ding-Wei ; Chao, Chung-Yen ; Li, Jiun-Haw ; Yang, C.C. ; Chen, Ming-Ching ; Lin, Hao-Hsiung

Author_Institution

Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan

Volume

9

Issue

5

fYear

1997

fDate

5/1/1997 12:00:00 AM

Firstpage

642

Lastpage

644

Abstract

Carrier capture processes in GaAs-AlGaAs multiple-quantum-well (MQW) waveguides are monitored using the time-resolved pump-probe technique. With appropriate selections of wavelength and pulse recompression, subpicosecond pulses at various wavelengths can be obtained for both nondegenerate and degenerate pump-probe experiments with various polarization combinations. Two samples of different quantum-well structures are compared. It is found that the carrier capture times (defined as the time period to reach probe transmission maximum after the pump) are in the range from 15 to 50 ps in the samples used. In the degenerate pump-probe measurements, a two-component decay is observed for one of the samples in the case of TM pump and TE probe.

Keywords

III-V semiconductors; aluminium compounds; gallium arsenide; high-speed optical techniques; optical pumping; optical waveguides; semiconductor quantum wells; 15 to 50 ps; GaAs-AlGaAs MQW waveguides; GaAs-AlGaAs multiple-quantum-well waveguides; TE probe; TM pump; carrier capture processes; degenerate pump-probe experiments; nondegenerate pump-probe experiments; polarization combinations; probe transmission maximum; pulse recompression; pump-probe studies; quantum-well structures; semiconductor multiple-quantum-well waveguides; subpicosecond pulses; time-resolved pump-probe technique; two-component decay; Carrier confinement; Chaos; Charge carrier processes; Monitoring; Polarization; Probes; Quantum well devices; Semiconductor waveguides; Time measurement; Wavelength measurement;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.588176

Filename

588176