• DocumentCode
    1555248
  • Title

    Quantum well carrier sweep out: relation to electroabsorption and exciton saturation

  • Author

    Fox, A. Mark ; Miller, David A B ; Livescu, Gabriela ; Cunningham, J.E. ; Jan, William Y.

  • Author_Institution
    AT&T Bell Labs.. Holmdel, NJ, USA
  • Volume
    27
  • Issue
    10
  • fYear
    1991
  • fDate
    10/1/1991 12:00:00 AM
  • Firstpage
    2281
  • Lastpage
    2295
  • Abstract
    The authors studied the effects of changing the barrier design of GaAs-AlxGa1-xAs quantum wells on the electroabsorption, exciton saturation, and carrier sweep-out times. Five samples with x values ranging from 0.2 to 0.4 and barrier thicknesses from 35 to 95 Å were studied. Within this range, the authors find that the electroabsorption is not very sensitive to the barrier thickness, but that the ionization field of the excitons approximately doubles for an increase of x from 0.2 to 0.4. The samples with high, thick barriers have lower internal quantum efficiencies than those with low, thin barriers. It was found that the exciton saturation intensity increases with increasing applied field, and decreasing barrier thickness or height. Time-resolved electroabsorption measurements confirm the variation in sweep-out rates between samples, and indicate that the escape mechanism at low field is probably a thermally-assisted tunneling process
  • Keywords
    III-V semiconductors; aluminium compounds; electroabsorption; excitons; gallium arsenide; optical saturation; semiconductor quantum wells; 35 to 95 Å; GaAs-AlxGa1-xAs; applied field; barrier design; barrier thicknesses; electroabsorption; escape mechanism; exciton saturation; ionization field; lower internal quantum efficiencies; quantum well carrier sweep out; saturation intensity; semiconductors; sweep-out times; thermally-assisted tunneling process; time resolved measurements; Carrier confinement; Excitons; Helium; Ionization; Potential well; Senior members; Stark effect; Switches; Thermionic emission; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.97272
  • Filename
    97272