Title :
Scintillators Based on
and
Single
Author :
Zorenko, Yuriy ; Gorbenko, Vitaliy ; Voznyak, Taras ; Konstankevych, Ivan ; Savchyn, Volodymyr ; Batentschuk, Miroslaw ; Winnacker, Albrecht ; Brabec, Christoph Josef
Author_Institution :
Inst. of Phys., Kazimierz Wielki Univ., Bydgoszcz, Poland
Abstract :
This research is directed on creating by liquid phase epitaxy the single crystalline film scintillators based on undoped and Bi doped CdWO4 compounds as well as the phoswich detector based on “CdWO4:Bi or CdWO4 films/CdWO4 or CdWO4:Bi crystals” epitaxial structures. The luminescent and scintillation properties of the undoped and Bi3+ doped (in a concentration range of 0.04-0.25 at. %) CdWO4 films, grown by LPE method from Na2WO4 flux, were compared with the properties of CdWO4 bulk crystal analogs, grown from melts by the Czochralski method. Using the traditional luminescence spectroscopy and the luminescence spectroscopy under excitation by pulsed synchrotron radiation with energy in the fundamental absorption range of CdWO4 host, we have also examined the nature of different emission centers and studied energy transfer processes from tungstate hosts to Bi3+ ions and defect centers in CdWO4 and CdWO4:Bi films and their crystal analogs.
Keywords :
bismuth; cadmium compounds; doping profiles; epitaxial layers; liquid phase epitaxial growth; photoluminescence; scintillation; solid scintillation detectors; synchrotron radiation; Bi3+ ions; CdWO4; CdWO4 absorption range; CdWO4 scintillators; CdWO4-Bi; CdWO4:Bi single crystalline film scintillators; Czochralski method; LPE method; Na2WO4 flux; bulk crystal analogs; emission centers; energy transfer processes; liquid phase epitaxy; luminescence spectroscopy; melt crystal growth; phoswich detector; pulsed synchrotron radiation excitation; tungstate hosts; Absorption; Bismuth; Crystals; Detectors; Epitaxial growth; Ions; Luminescence; Bi dopant; liquid phase epitaxy; luminescence; scintillators; single crystals and single crystalline films;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2201171