• DocumentCode
    1555783
  • Title

    Material-based comparison for power heterojunction bipolar transistors

  • Author

    Gao, Guang-bo ; Morkoc, Hadis

  • Author_Institution
    Illinois Univ., Urbana, IL, USA
  • Volume
    38
  • Issue
    11
  • fYear
    1991
  • fDate
    11/1/1991 12:00:00 AM
  • Firstpage
    2410
  • Lastpage
    2416
  • Abstract
    Various materials are studied to determine their potential in power heterojunction bipolar transistors (HBTs). The authors first start by generating an HBT figure of merit (FOM) which is defined as the product of operating frequency and output power of the HBT with 3-dB power gain. By using the FOM and available material parameters, a material-based comparison of HBT performance is done. The general tendency is for use of narrow-bandgap materials, such as Ge or InGaAs, as the base and wide-bandgap materials, such as AlGaAs, InP, SiC, or GaN, as the collector, technology permitting
  • Keywords
    heterojunction bipolar transistors; power transistors; semiconductor device models; AlGaAs; GaN; Ge; HBT figure of merit; InGaAs; InP; SiC; material-based comparison; narrow-bandgap materials; operating frequency; output power; power heterojunction bipolar transistors; wide-bandgap materials; Bipolar transistors; Cutoff frequency; Electron emission; Electron mobility; Gallium arsenide; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Power generation; Silicon germanium;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.97401
  • Filename
    97401