DocumentCode
1555783
Title
Material-based comparison for power heterojunction bipolar transistors
Author
Gao, Guang-bo ; Morkoc, Hadis
Author_Institution
Illinois Univ., Urbana, IL, USA
Volume
38
Issue
11
fYear
1991
fDate
11/1/1991 12:00:00 AM
Firstpage
2410
Lastpage
2416
Abstract
Various materials are studied to determine their potential in power heterojunction bipolar transistors (HBTs). The authors first start by generating an HBT figure of merit (FOM) which is defined as the product of operating frequency and output power of the HBT with 3-dB power gain. By using the FOM and available material parameters, a material-based comparison of HBT performance is done. The general tendency is for use of narrow-bandgap materials, such as Ge or InGaAs, as the base and wide-bandgap materials, such as AlGaAs, InP, SiC, or GaN, as the collector, technology permitting
Keywords
heterojunction bipolar transistors; power transistors; semiconductor device models; AlGaAs; GaN; Ge; HBT figure of merit; InGaAs; InP; SiC; material-based comparison; narrow-bandgap materials; operating frequency; output power; power heterojunction bipolar transistors; wide-bandgap materials; Bipolar transistors; Cutoff frequency; Electron emission; Electron mobility; Gallium arsenide; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Power generation; Silicon germanium;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.97401
Filename
97401
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