DocumentCode :
1555833
Title :
Splitting-based importance-sampling algorithm for fast simulation of Markov reliability models with general repair-policies
Author :
Juneja, Sandeep ; Shahabuddin, Perwez
Author_Institution :
Indian Inst. of Technol., Delhi, India
Volume :
50
Issue :
3
fYear :
2001
fDate :
9/1/2001 12:00:00 AM
Firstpage :
235
Lastpage :
245
Abstract :
Markov chains with small transition probabilities occur while modeling the reliability of systems where the individual components are highly reliable and quickly repairable. Complex inter-component dependencies can exist and the state space involved can be huge, making these models analytically and numerically intractable. Naive simulation is also difficult because the event of interest (system failure) is rare, so that a prohibitively large amount of computation is needed to obtain samples of these events. An earlier paper (Juneja et al., 2001) proposed an importance sampling scheme that provides large efficiency increases over naive simulation for a very general class of models including reliability models with general repair policies such as deferred and group repairs. However, there is a statistical penalty associated with this scheme when the corresponding Markov chain has high probability cycles as may be the case with reliability models with general repair policies. This paper develops a splitting-based importance-sampling technique that avoids this statistical penalty by splitting paths at high probability cycles and thus achieves bounded relative-error in a stronger sense than in previous attempts
Keywords :
Markov processes; discrete time systems; failure analysis; importance sampling; maintenance engineering; probability; reliability; state-space methods; Markov reliability models simulation; bounded relative-error; general repair-policies; inter-component dependencies; probability cycles; splitting-based importance-sampling algorithm; system failure; transition probabilities; Computational modeling; Discrete event simulation; Engineering profession; Monte Carlo methods; Numerical models; Probability; Random variables; State-space methods; Stochastic processes; Time measurement;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.974121
Filename :
974121
Link To Document :
بازگشت