• DocumentCode
    1555838
  • Title

    Techniques for fast simulation of models of highly dependable systems

  • Author

    Nicola, Victor F. ; Shahabuddin, Perwez ; Nakayama, Marvin K.

  • Author_Institution
    Dept. of Electr. Eng., Twente Univ., Enschede, Netherlands
  • Volume
    50
  • Issue
    3
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    246
  • Lastpage
    264
  • Abstract
    With the ever-increasing complexity and requirements of highly dependable systems, their evaluation during design and operation is becoming more crucial. Realistic models of such systems are often not amenable to analysis using conventional analytic or numerical methods. Therefore, analysts and designers turn to simulation to evaluate these models. However, accurate estimation of dependability measures of these models requires that the simulation frequently observes system failures, which are rare events in highly dependable systems. This renders ordinary Simulation impractical for evaluating such systems. To overcome this problem, simulation techniques based on importance sampling have been developed, and are very effective in certain settings. When importance sampling works well, simulation run lengths can be reduced by several orders of magnitude when estimating transient as well as steady-state dependability measures. This paper reviews some of the importance-sampling techniques that have been developed in recent years to estimate dependability measures efficiently in Markov and nonMarkov models of highly dependable systems
  • Keywords
    Markov processes; failure analysis; importance sampling; numerical analysis; probability; reliability; Markov models; dependability measures; fast simulation techniques; highly dependable systems models; importance sampling; nonMarkov models; steady-state dependability measures; system failures; transient dependability measures; Analytical models; Availability; Degradation; Discrete event simulation; Length measurement; Monte Carlo methods; Operating systems; Particle measurements; Steady-state; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.974122
  • Filename
    974122