DocumentCode :
1555958
Title :
Antimonide-based devices for thermophotovoltaic applications
Author :
Hitchcock, Collin W. ; Gutmann, Ronald J. ; Borrego, Jose M. ; Bhat, Ishwara B. ; Charache, Greg W.
Author_Institution :
Center for Integrated Electron. & Electron. Manuf., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
46
Issue :
10
fYear :
1999
fDate :
10/1/1999 12:00:00 AM
Firstpage :
2154
Lastpage :
2161
Abstract :
Thermophotovoltaic (TPV) devices have been fabricated using ternary and quaternary layers grown by metalorganic vapor phase epitaxy (MOVPE) on GaSb substrates. GaInSb ternary devices were grown with buffer layers to accommodate the lattice mismatch, and GaInAsSb quaternary devices were grown with lattice-matched compositions. Improved devices are obtained when optical absorption occurs in the p-layer due to the longer minority carrier diffusion length. Thick emitter p/n devices are limited by surface recombination, with highest quantum efficiency and lowest dark current being achieved with epitaxially grown surface passivation layers on lattice-matched MOVPE quaternaries. Thin emitter/thick base, n/p devices are very promising since surface passivation is less critical than for p-emitter devices
Keywords :
III-V semiconductors; MOCVD; carrier lifetime; gallium arsenide; gallium compounds; indium compounds; leakage currents; minority carriers; passivation; semiconductor growth; short-circuit currents; surface recombination; thermophotovoltaic cells; vapour phase epitaxial growth; GaInAsSb; GaInAsSb quaternary devices; GaInSb; GaInSb ternary devices; GaSb; GaSb substrates; MOVPE; buffer layers; dark current; epitaxially grown surface passivation layers; lattice mismatch; lattice-matched compositions; metalorganic vapor phase epitaxy; minority carrier diffusion length; optical absorption; p-layer; quantum efficiency; surface recombination; thermophotovoltaic devices; thick emitter p/n devices; thin emitter/thick base n/p devices; Absorption; Buffer layers; Epitaxial growth; Epitaxial layers; Lattices; Optical buffering; Optical devices; Passivation; Stimulated emission; Substrates;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.792011
Filename :
792011
Link To Document :
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