Title :
Trimming phase and birefringence errors in photosensitivity-locked planar optical circuits
Author :
Chen, Kevin P. ; Herman, Peter R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Abstract :
A strong and stable photosensitivity response was permanently locked into hydrogen-loaded Mach-Zehnder planar waveguide circuits by 248-nm KrF-laser preirradiation. The photosensitivity enhancement survived thermal annealing up to 225 /spl deg/C. Post-laser trimming at 248 nm induced an unsaturated refractive index increase of 0.002, and a birefringence change of /spl utri/n /spl sim/ 0.0001. This combination of photosensitivity locking and post-laser tuning affords wide latitude for precise and stable tuning of waveguide phase errors and birefringence.
Keywords :
Mach-Zehnder interferometers; birefringence; electro-optical modulation; integrated optics; laser beam machining; optical planar waveguides; optical waveguide components; refractive index; 225 C; 248 nm; KrF-laser preirradiation; birefringence errors; hydrogen-loaded Mach-Zehnder planar waveguide circuits; photosensitivity enhancement; photosensitivity locking; photosensitivity-locked planar optical circuits; polarization modes; post-laser tuning; strong stable photosensitivity response; thermal annealing; trimming phase; unsaturated refractive index increase; waveguide phase error tuning; Birefringence; Circuits; Fiber lasers; Hydrogen; Laser stability; Optical interferometry; Optical refraction; Optical waveguides; Programmable control; Waveguide lasers;
Journal_Title :
Photonics Technology Letters, IEEE
