DocumentCode :
1556144
Title :
A dual gate flash EEPROM cell with two-bit storage capacity
Author :
Lorenzini, Martino ; Rudan, Massimo V. ; Baccarani, Giorgio
Author_Institution :
Dipartimento di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
Volume :
20
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
182
Lastpage :
189
Abstract :
In this paper, a dual-gate Flash EEPROM cell is proposed which allows the storage of two bits with only a slight increase in the cell size with respect to the single-bit case. Extensive simulations show that the basic functions of the Flash cell, namely reading, programming and erasing are possible with a suitable setting of the applied voltages. A simplified model based on the equivalent circuit of the cell allows for a qualitative interpretation of the obtained results, providing at the same time useful hints for the optimization of the cell parameters. Moreover, a schematic of the cell array is presented and some issues related to the array organization are briefly discussed
Keywords :
EPROM; equivalent circuits; integrated memory circuits; dual gate flash EEPROM cell; equivalent circuit model; multilevel charge storage; nonvolatile memory; simulation; two-bit storage capacity; Circuit simulation; EPROM; Equivalent circuits; Functional programming; Nonvolatile memory; Numerical simulation; Secondary generated hot electron injection; Threshold voltage; Tunneling; Voltage control;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.588572
Filename :
588572
Link To Document :
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