• DocumentCode
    1556188
  • Title

    A CMOS integrated pulse mode alpha-particle counter for application in radon monitoring

  • Author

    Ahmed, A. ; Walkey, D.J. ; Tarr, N.G.

  • Author_Institution
    Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
  • Volume
    44
  • Issue
    3
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    1425
  • Lastpage
    1430
  • Abstract
    A custom integrated circuit for detecting alpha particles for application in the monitoring of radon has been designed and tested. The design uses the reverse-biased well to substrate capacitance of a p-n junction in a conventional CMOS process as a sense capacitor for incident alpha particles, A simple CMOS inverter is used as an analog amplifier to detect the small potential change induced by an alpha-particle strike on the sense capacitor. The design was implemented in a 1.2-μm conventional CMOS process with a sense capacitor area of 110 μm2. Tests carried out under vacuum conditions using a calibrated 241Am alpha-particle source showed an output voltage swing of ⩾2.0 V for an alpha event. The detector is also shown to have good immunity to noise and high-quantum efficiency for alpha particles
  • Keywords
    CMOS analogue integrated circuits; alpha-particle detection; amplifiers; detector circuits; nuclear electronics; radiation monitoring; radon; CMOS integrated pulse mode alpha-particle counter; alpha particle detection; analog amplifier; calibrated 241Am alpha-particle source; high-quantum efficiency; incident alpha particles; noise immunity; output voltage swing; p-n junction; potential change; radon monitoring; reverse-biased well; substrate capacitance; vacuum conditions; Alpha particles; Application specific integrated circuits; CMOS process; Capacitance; Capacitors; Circuit testing; Counting circuits; Integrated circuit testing; Monitoring; P-n junctions;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.588588
  • Filename
    588588