DocumentCode
1556188
Title
A CMOS integrated pulse mode alpha-particle counter for application in radon monitoring
Author
Ahmed, A. ; Walkey, D.J. ; Tarr, N.G.
Author_Institution
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
Volume
44
Issue
3
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
1425
Lastpage
1430
Abstract
A custom integrated circuit for detecting alpha particles for application in the monitoring of radon has been designed and tested. The design uses the reverse-biased well to substrate capacitance of a p-n junction in a conventional CMOS process as a sense capacitor for incident alpha particles, A simple CMOS inverter is used as an analog amplifier to detect the small potential change induced by an alpha-particle strike on the sense capacitor. The design was implemented in a 1.2-μm conventional CMOS process with a sense capacitor area of 110 μm2. Tests carried out under vacuum conditions using a calibrated 241Am alpha-particle source showed an output voltage swing of ⩾2.0 V for an alpha event. The detector is also shown to have good immunity to noise and high-quantum efficiency for alpha particles
Keywords
CMOS analogue integrated circuits; alpha-particle detection; amplifiers; detector circuits; nuclear electronics; radiation monitoring; radon; CMOS integrated pulse mode alpha-particle counter; alpha particle detection; analog amplifier; calibrated 241Am alpha-particle source; high-quantum efficiency; incident alpha particles; noise immunity; output voltage swing; p-n junction; potential change; radon monitoring; reverse-biased well; substrate capacitance; vacuum conditions; Alpha particles; Application specific integrated circuits; CMOS process; Capacitance; Capacitors; Circuit testing; Counting circuits; Integrated circuit testing; Monitoring; P-n junctions;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.588588
Filename
588588
Link To Document