• DocumentCode
    1556303
  • Title

    Analysis and measurement of mode polarizers in square waveguide

  • Author

    Gaiewski, W.R. ; Dunleavy, L.P. ; Castro, A., Jr.

  • Author_Institution
    Univ. of South Florida, Tampa, FL, USA
  • Volume
    45
  • Issue
    6
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    997
  • Lastpage
    1000
  • Abstract
    A general analysis approach for strip metallization structures enclosed in rectangular or square waveguide is presented. The technique involves the novel application of a commercially available 2.5-dimensional (2.5-D) method-of-moments-based (MoM) electromagnetic (EM) analysis tool to a three-dimensional (3-D) waveguide problem. Very good agreement is demonstrated between computed and measured results for several printed strip linear polarizers embedded within a square waveguide environment. This paper, to the authors´ knowledge, represents the first such comparison of phase and magnitude between computed and measured data for strip grid polarizers in a waveguide environment. The developed approach involves construction of a theoretical waveguide “test fixture” and an associated theoretical de-embedding procedure. Computational advantages are expected over the alternative approach of using a finite-element-based fully 3-D analysis approach. The polarizer results have potential application to shielded versions of quasi-optic array components that have been demonstrated in open geometries, as well as to multimode antenna feeds, waveguide filters, and matching networks
  • Keywords
    electromagnetic wave polarisation; metallisation; method of moments; rectangular waveguides; waveguide components; 2.5-dimensional method-of-moments electromagnetic analysis; de-embedding; matching network; mode polarizer; multimode antenna feed; printed strip grid linear polarizer; rectangular waveguide; shielded quasi-optic array component; square waveguide; strip metallization; test fixture; three-dimensional waveguide; waveguide filter; Electromagnetic analysis; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic wave polarization; Electromagnetic waveguides; Embedded computing; Grid computing; Metallization; Rectangular waveguides; Strips;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.588616
  • Filename
    588616