DocumentCode :
1556315
Title :
Investigation of Hole-Blocking Contacts for High-Conversion-Gain Amorphous Selenium Detectors for X-Ray Imaging
Author :
Abbaszadeh, Shiva ; Allec, Nicholas ; Ghanbarzadeh, Sina ; Shafique, Umar ; Karim, Karim S.
Author_Institution :
Electrical and Computer Engineering Department, University of Waterloo, Waterloo, Canada
Volume :
59
Issue :
9
fYear :
2012
Firstpage :
2403
Lastpage :
2409
Abstract :
In this paper, we investigated different organic and inorganic hole-blocking contacts for amorphous selenium (a-Se)-based photodetectors: \\hbox {CeO}_{2} , \\hbox {TiO}_{2} , perylene tetracarboxylic bisbenzimidazole (PTCBI), and polyimide (PI). \\hbox {CeO}_{2} has previously been used as a blocking layer for high-gain a-Se devices. \\hbox {TiO}_{2} has similar properties to \\hbox {CeO}_{2} . PTCBI has a higher ionization potential compared to a-Se and has a very low hole mobility. PI is a common insulator in the semiconductor industry. It was found that an 800-nm PI layer reduces the dark current by more than two orders of magnitude in comparison with 30 nm of \\hbox {CeO}_{2} , 20 nm of \\hbox {TiO}_{2} , and 50 nm of PTCBI. No significant charge trapping was found in the devices consisting of an 800-nm PI layer. Unlike previously reported inorganic hole-blocking contact technology, PI layers further benefit from a simple spin coating fabrication step before evaporation of a-Se. Photodetector samples incorporating the PI layer are tested at high electric fields, and gains reaching 4.4 were observed at an electric field >\\hbox {80} \\hbox {V}/\\mu \\hbox {m} . We conclude that using a PI layer is a promising step in the development of high-conversion-gain detectors for emerging applications in large-area medical diagnostic imaging, crystallography, and nondestructive test.
Keywords :
Dark current; Detectors; Electric potential; Indium tin oxide; Photodetectors; X-ray imaging; Amorphous selenium (a-Se); X-ray imaging; high conversion gain; high quantum efficiency; large-area electronics;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2204998
Filename :
6237521
Link To Document :
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