DocumentCode
1556334
Title
Interferometric imaging with terahertz pulses
Author
Johnson, Jon L. ; Dorney, Timothy D. ; Mittleman, Daniel M.
Author_Institution
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
Volume
7
Issue
4
fYear
2001
Firstpage
592
Lastpage
599
Abstract
We demonstrate a new reflection imaging technique using single-cycle pulses, in which the sample to be imaged is placed at the focus of a lens in one arm of a Michelson interferometer. The detected signal is the superposition of the pulses from the two arms of the interferometer, one with a sample and one with a reference mirror. Because of the Gouy phase shift from the lens in the sample arm, these two pulses are nearly π out of phase, and can destructively interfere. This leads to a strong cancellation of the measured waveform and a nearly background-free imaging method. We demonstrate the technique using terahertz time-domain spectroscopy and show that the destructive interference provides enhanced sensitivity to features in the sample that are much thinner than the coherence length of the radiation. This technique could be valuable in any low-coherence tomographic measurement in which the reflected electric field can be measured directly
Keywords
Michelson interferometers; antennas; lenses; light interferometry; mirrors; optical focusing; optical pulse generation; optical signal detection; optical tomography; photoconducting devices; submillimetre wave imaging; submillimetre wave spectroscopy; Gouy phase shift; Michelson interferometer; background-free imaging method; coherence length; destructive interference; detected signal; interferometric imaging; lens; low-coherence tomographic measurement; reference mirror; reflected electric field; reflection imaging technique; single-cycle pulses; terahertz pulse imaging; terahertz time-domain spectroscopy; Arm; Electric variables measurement; Focusing; Lenses; Mirrors; Optical imaging; Phase shifting interferometry; Reflection; Signal detection; Time domain analysis;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/2944.974230
Filename
974230
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