• DocumentCode
    1556374
  • Title

    Si-TaSi2 composite photodiodes with wavelength-independent quantum efficiency

  • Author

    Levinson, M. ; Schlafer, J. ; Ditchek, B.M.

  • Author_Institution
    GTE Lab. Inc., Waltham, MA, USA
  • Volume
    38
  • Issue
    11
  • fYear
    1991
  • fDate
    11/1/1991 12:00:00 AM
  • Firstpage
    2563
  • Lastpage
    2565
  • Abstract
    Photodiodes have been demonstrated which utilize the grown-in Schottky junctions of Si-TaSi2 eutectic composite material to give wavelength-independent quantum efficiencies of more than 80% (corrected for reflection loss) over nearly the entire visible and near-infrared portions of the spectrum. Noise measurements show a 1/f component which produces less than 10-dB excess noise-equivalent power relative to the shot noise limit at frequencies above 800 Hz. The good quality of these devices, together with their constant quantum efficiency over a wide range of wavelength, makes them of interest for further development in many photodetector applications
  • Keywords
    Schottky-barrier diodes; electron device noise; elemental semiconductors; photodiodes; silicon; tantalum compounds; 1/f noise component; Si-TaSi2 eutectic composite; grown-in Schottky junctions; photodetector applications; photodiodes; shot noise limit; wavelength-independent quantum efficiency; Composite materials; Noise measurement; Photodetectors; Photodiodes; Schottky barriers; Schottky diodes; Semiconductor device noise; Semiconductor diodes; Transmission line matrix methods; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.97424
  • Filename
    97424