DocumentCode
1556374
Title
Si-TaSi2 composite photodiodes with wavelength-independent quantum efficiency
Author
Levinson, M. ; Schlafer, J. ; Ditchek, B.M.
Author_Institution
GTE Lab. Inc., Waltham, MA, USA
Volume
38
Issue
11
fYear
1991
fDate
11/1/1991 12:00:00 AM
Firstpage
2563
Lastpage
2565
Abstract
Photodiodes have been demonstrated which utilize the grown-in Schottky junctions of Si-TaSi2 eutectic composite material to give wavelength-independent quantum efficiencies of more than 80% (corrected for reflection loss) over nearly the entire visible and near-infrared portions of the spectrum. Noise measurements show a 1/f component which produces less than 10-dB excess noise-equivalent power relative to the shot noise limit at frequencies above 800 Hz. The good quality of these devices, together with their constant quantum efficiency over a wide range of wavelength, makes them of interest for further development in many photodetector applications
Keywords
Schottky-barrier diodes; electron device noise; elemental semiconductors; photodiodes; silicon; tantalum compounds; 1/f noise component; Si-TaSi2 eutectic composite; grown-in Schottky junctions; photodetector applications; photodiodes; shot noise limit; wavelength-independent quantum efficiency; Composite materials; Noise measurement; Photodetectors; Photodiodes; Schottky barriers; Schottky diodes; Semiconductor device noise; Semiconductor diodes; Transmission line matrix methods; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.97424
Filename
97424
Link To Document