• DocumentCode
    1556504
  • Title

    A model-fitting approach to cluster validation with application to stochastic model-based image segmentation

  • Author

    Zhang, J. ; Modestino, J.W.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    12
  • Issue
    10
  • fYear
    1990
  • fDate
    10/1/1990 12:00:00 AM
  • Firstpage
    1009
  • Lastpage
    1017
  • Abstract
    A clustering scheme is used for model parameter estimation. Most of the existing clustering procedures require prior knowledge of the number of classes, which is often, as in unsupervised image segmentation, unavailable and must be estimated. This problem is known as the cluster validation problem. For unsupervised image segmentation the solution of this problem directly affects the quality of the segmentation. A model-fitting approach to the cluster validation problem based on Akaike´s information criterion is proposed, and its efficacy and robustness are demonstrated through experimental results for synthetic mixture data and image data
  • Keywords
    parameter estimation; pattern recognition; Akaike´s information criterion; cluster validation; image data; model-fitting; parameter estimation; pattern recognition; stochastic model-based image segmentation; synthetic mixture data; Biological system modeling; Clustering algorithms; Computer vision; Image segmentation; Layout; Pattern recognition; Robustness; Stochastic processes; Systems engineering and theory; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.58873
  • Filename
    58873