DocumentCode :
1556670
Title :
Space- and surface-charge behavior analysis of plasma-preprocessed dielectric thin films
Author :
Takashima, Kazunori ; Oda, Tetsuji
Author_Institution :
Dept. of Electr. Eng., Tokyo Univ., Japan
Volume :
35
Issue :
5
fYear :
1999
Firstpage :
1192
Lastpage :
1197
Abstract :
In order to study the space-charge behavior in dielectric thin films, a space-charge distribution measuring system based on a laser-induced pressure pulse (LIPP) method was constructed. The pressure pulse was generated by irradiating the absorbent on a sample surface with a mode-locked picosecond YAG laser to achieve good spatial resolution. From a LIPP response of a polyvinylidene fluoride piezoelectric thin film, an in-depth profile of the system is estimated. For example, it was estimated to be about 2 μm for polytetrafluoroethylene (PTFE) thin film. By using the space-charge density distribution measurement, space- and surface-charge behavior of the corona-charged PTFE thin film was studied. The effect of the antistatic process using low-pressure discharge plasma and a charge-elimination process by dipping in city water was also studied. Plasma processing enhances the effect of charge elimination by dipping in city water
Keywords :
dielectric thin films; measurement by laser beam; organic insulating materials; plasma materials processing; polymers; space charge; surface charging; PTFE thin film; antistatic process; charge-elimination process; city water dipping; laser-induced pressure pulse LIPP method; low-pressure discharge plasma; mode-locked picosecond YAG laser; plasma-preprocessed dielectric thin films; polyvinylidene fluoride piezoelectric thin film; space-charge behavior analysis; space-charge density distribution measurement; space-charge distribution measuring system; surface-charge behavior analysis; Cities and towns; Dielectric measurements; Dielectric thin films; Laser mode locking; Optical pulse generation; Piezoelectric films; Plasma density; Plasma materials processing; Plasma measurements; Pulse measurements;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.793384
Filename :
793384
Link To Document :
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