Title :
A Novel Method for Reducing Metal Variation With Statistical Static Timing Analysis
Author :
Foreman, Eric A. ; Habitz, Peter A. ; Cheng, Ming-C ; Visweswariah, Chandu
Author_Institution :
Syst. & Technol. Group, IBM, Essex Junction, VT, USA
Abstract :
Process variation continues to increase with new technologies. With the advent of statistical static timing analysis (SSTA), multiple independent sources of variation can be modeled. This paper proposes a novel technique to reduce variability of metal process variation in SSTA. This novel method maximizes sensitivity cancellation to minimize variability. The developed methodology is simulated with SSTA in 65-nm technology and shows a reduction in variability.
Keywords :
integrated circuit interconnections; statistical analysis; SSTA; metal interconnect variation; metal variation reduction; multiple independent sources; sensitivity cancellation; size 65 nm; statistical static timing analysis; Capacitance; Delay; Integrated circuit interconnections; Metals; Resistance; Sensitivity; Application-specific integrated circuits; semiconductor–metal interfaces; timing circuits; very large-scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2012.2190068
