• DocumentCode
    1557017
  • Title

    Concurrent Generation of Concurrent Programs for Post-Silicon Validation

  • Author

    Adir, Allon ; Nahir, Amir ; Ziv, Avi

  • Author_Institution
    IBM Res., Haifa, Israel
  • Volume
    31
  • Issue
    8
  • fYear
    2012
  • Firstpage
    1297
  • Lastpage
    1302
  • Abstract
    The continuing trend toward increased parallelism in processor design can be seen in both the growing number of processor cores per system and in on-core hardware mechanisms that assist parallelism, such as multithreading and cache hierarchies. This complexity exacerbates the problem of ensuring the functional correctness of such hardware systems. The growing importance of post-silicon validation is leading to an emerging type of parallel application, namely, the hardware exerciser. We describe a method for exercising parallel hardware by generating pseudorandom concurrent test programs. The test generation is carried out on the tested parallel platform and thus the generator itself is also a concurrent program. We describe the challenges associated with this technology and the approach used by the Threadmill hardware exerciser, a tool developed for the post-silicon validation of the IBM POWER7 processor.
  • Keywords
    elemental semiconductors; multiprocessing systems; parallel programming; program testing; silicon; IBM POWER7 processor; Si; Threadmill hardware exerciser; cache hierarchies; concurrent generation; hardware exerciser; multithreading; on-core hardware mechanism; parallel hardware; parallel platform; post-silicon validation; processor core; processor design; pseudorandom concurrent test program; test generation; Generators; Hardware; Instruction sets; Integrated circuit interconnections; Integrated circuit modeling; Silicon; Timing; Functional verification; multiprocessor verification; multithreading; post-silicon validation; stimuli generation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2012.2189394
  • Filename
    6238397