Title :
An educational perspective on in-circuit testing
Author :
Beaujean, D.A. ; Morgan, S.B.
Author_Institution :
Dept. of Electr. & Electron. Eng., Polytech. of Wales, Pontypridd, UK
fDate :
4/1/1988 12:00:00 AM
Abstract :
The increasing use of CADMAT tools in the production environment presents a major challenge in personnel training. Electronics manufacturers introducing ATE are quickly made aware of the scarcity of test engineers experienced in using this equipment and of the need for rapid training to increase the pool of available talent. The authors give consideration to the ways in which ATE training might be implemented and an outline scheme is described for a three-day course on in-circuit testing
Keywords :
automatic test equipment; educational courses; integrated circuit testing; printed circuit testing; training; ATE; CADMAT tools; IC testing; education; in-circuit testing; personnel training; three-day course;
Journal_Title :
Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A