DocumentCode :
1557860
Title :
Measurements of transient response on lossy microstrips with small dimensions
Author :
Lin, M.S. ; Engvik, A.H. ; Loos, J.S.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Volume :
37
Issue :
11
fYear :
1990
fDate :
11/1/1990 12:00:00 AM
Firstpage :
1383
Lastpage :
1393
Abstract :
Measurements were made of the behavior of transient pulses on terminated microstrips with small dimensions (2.5 μm thick and 10-40 μm wide). The dependence of transient behavior on the width, length, and dielectric thickness of microstrips is reported, providing a guide for choosing design parameters of lossy microstrips. The experimental results indicate that these small microstrips can be used for high-speed digital signal transmission, with a rise time at least as short as 40 ps, provided that the line resistance is taken into account and that proper termination is used. Pulse attenuations are found to be consistent with purely resistive losses when the skin effect is included; no significant losses can be attributed to the polyimide dielectric. The reflection from the interface between the lossless and lossy lines is experimentally shown to be small for well-matched cases, but to be appreciable for poorly matched cases. The standard transmission theory for lossy lines under the conditions of these experiments is used successfully to describe the experimental results
Keywords :
losses; strip lines; transient response; transmission line theory; 10 to 40 micron; 2.5 micron; 40 ps; design parameters; high-speed digital signal transmission; lossy microstrips; polyimide dielectric; pulse attenuations; resistive losses; rise time; skin effect; terminated microstrips; transient pulses; transient response; transmission theory; Attenuation; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Loss measurement; Microstrip; Pulse measurements; Skin effect; Thickness measurement; Transient response;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/31.62413
Filename :
62413
Link To Document :
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