Fault detection for linear analog IC-the method of short-circuit admittance parameters

Author

Li, Feng ; Woo, Peng-Yung

Author_Institution

Dept. of Electron. Eng., Fudan Univ., Shanghai, China

Volume

49

Issue

1

fYear

2002

fDate

1/1/2002 12:00:00 AM

Firstpage

105

Lastpage

108

Abstract

A fault detection method, i.e. the short-circuit admittance parameters method, for linear analog ICs is proposed in this paper. Only two voltage measurements at the ports of the circuit are suggested to decide whether the circuit is working normally. This method can be used to design automatic circuit fault detection equipment for technicians to decide whether there are any faults in linear analog circuits. The attractive merits of this method are component parameter tolerance and error reduction in measurement and calculation

Keywords

analogue integrated circuits; electric admittance; fault location; integrated circuit measurement; linear network analysis; voltage measurement; automatic circuit fault detection equipment; circuit ports; component parameter tolerance; error reduction; fault detection method; linear analog IC; linear analog circuits; short-circuit admittance parameters method; voltage measurements; Admittance; Analog circuits; Analog integrated circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Manufacturing; Production; Voltage measurement;

fLanguage

English

Journal_Title

Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on

Publisher

ieee

ISSN

1057-7122

Type

jour

DOI

10.1109/81.974884

Filename

974884