• DocumentCode
    1558037
  • Title

    Automatic generation and compaction of March tests for memory arrays

  • Author

    Zarrineh, Kamran ; Upadhyaya, Shambhu J. ; Chakravarty, Sreejit

  • Author_Institution
    Sun Microelectron., Chelmsford, MA, USA
  • Volume
    9
  • Issue
    6
  • fYear
    2001
  • Firstpage
    845
  • Lastpage
    857
  • Abstract
    Given a set of memory array faults, the problem of computing a compact March test that detects all specified memory array faults is addressed. In this paper, we propose a novel approach in which every memory array fault is modeled by a set of primitive memory faults. A primitive March test is defined for each primitive memory fault. We show that March tests that detect the specified memory array faults are composed of primitive March tests. A method to compact the March tests for the specified memory array faults is described. A set of examples to illustrate the approach is presented. Experimental results demonstrate the productivity gained using the proposed framework.
  • Keywords
    automatic test pattern generation; fault location; integrated circuit reliability; integrated circuit testing; integrated memory circuits; March test; March tests; automatic test compaction; automatic test generation; memory array fault detection; memory array fault model; memory array faults; memory arrays; memory faults; primitive March test; primitive memory faults; productivity; specified memory array faults; transition sequence; Automatic testing; Circuit faults; Circuit testing; Compaction; Costs; Digital signal processing; Fault detection; Logic arrays; Logic testing; Read-write memory;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.974898
  • Filename
    974898