DocumentCode :
1558060
Title :
A stochastic model for the interconnection topology of digital circuits
Author :
Verplaetse, Peter ; Stroobandt, Dirk ; Van Campenhout, Jan
Author_Institution :
Dept. of Electron. & Inf. Syst., Ghent Univ., Belgium
Volume :
9
Issue :
6
fYear :
2001
Firstpage :
938
Lastpage :
942
Abstract :
Rent´s rule has been successfully applied to a priori estimation of wire length distributions. However, this approach is very restrictive: the circuits are assumed to be homogeneous. In this paper, recursive clustering is described as a more advanced model for the partitioning behavior of digital circuits. It is applied to predict the variance of the terminal count distribution. First, the impact of the block degree distribution is analyzed with a simple model. A more refined model incorporates the effect of stochastic self similarity. Finally, the model is further extended to describe the effects of heterogeneity. This model is a promising candidate for more accurate a priori estimation tools.
Keywords :
VLSI; digital integrated circuits; estimation theory; integrated circuit interconnections; integrated circuit modelling; logic partitioning; network topology; stochastic systems; Rent´s rule; digital circuits; interconnection topology; partitioning; recursive clustering; stochastic model; terminal count distribution; Circuit topology; Digital circuits; Helium; Integrated circuit interconnections; Logic circuits; Minimization; Recursive estimation; Statistics; Stochastic processes; Wire;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.974907
Filename :
974907
Link To Document :
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