• DocumentCode
    1558213
  • Title

    A time-domain circuit simulator for coupled-cavity traveling-wave tubes

  • Author

    Qiu, Weiguang ; Lee, Hae June ; Verboncoeur, John P. ; Birdsall, Charles K.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    29
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    911
  • Lastpage
    920
  • Abstract
    The Curnow equivalent circuit was used to predict the dispersion of cold coupled-cavity traveling-wave tubes, as wen as the voltage and current characteristics for lossless and lossy multicavity circuits. The equivalent circuit is extended to have three ports. The added beam port allows the future modeling of the interaction between beam and cavity. Losses are introduced into the circuit as resistors in series with the corresponding inductors. The time-domain solution to the multicavity circuit is developed. It can be applied to the full-spectrum signal. It is also useful for the transient analysis for both single frequency and full-spectrum signals, including the turn-on transients. Numerical methods to solve the time-domain equations are discussed; a second-order leap-frog method and a fourth-order Runge-Kutta method are implemented and analyzed. Simulation results from both codes are compared, and match well with the theory
  • Keywords
    Runge-Kutta methods; time-domain analysis; travelling wave tubes; Curnow equivalent circuit; coupled-cavity traveling-wave tubes; current characteristics; fourth-order Runge-Kutta method; full-spectrum signal; inductors; lossless multicavity circuits; lossy multicavity circuits; multicavity circuit; numerical methods; resistors; second-order leap-frog method; time-domain circuit simulator; time-domain solution; transient analysis; turn-on transients; voltage characteristics; Circuit simulation; Coupling circuits; Equations; Equivalent circuits; Frequency; Inductors; Resistors; Time domain analysis; Transient analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.974979
  • Filename
    974979