DocumentCode :
1558648
Title :
Accurate Analysis of Plasmonic Devices With a New Drude Two Critical Points MRTD Method
Author :
Letizia, Rosa ; Pinto, Domenico ; Obayya, Salah S A
Author_Institution :
Eng. Dept., Lancaster Univ., Lancaster, UK
Volume :
24
Issue :
18
fYear :
2012
Firstpage :
1587
Lastpage :
1590
Abstract :
A new Drude two critical points (D-2CP) multiresolution time domain numerical method for the simulation of surface plasmon polariton in metallic inclusions is presented. A D-2CP model is used to accurately describe the dielectric function of the metallic inclusions, and it is compared with other Drude models reported in the literature. The superior accuracy given by the D-2CP model avoids the formation of spurious reflections at the boundary interface between metal and dielectric, which can greatly affect the accuracy of the numerical results.
Keywords :
critical points; plasmonics; polaritons; surface plasmons; time-domain analysis; D-2CP model; MRTD method; dielectric function; drude two critical points; metallic inclusions; multiresolution time domain numerical method; plasmonic devices; spurious reflections; surface plasmon polariton; Accuracy; Computational modeling; Numerical models; Plasmons; Silver; Time domain analysis; Drude model; Drude two critical points model (D-2CP); multiresolution time domain (MRTD); plasmonic waveguides;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2012.2209634
Filename :
6244851
Link To Document :
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