DocumentCode :
1558789
Title :
Partitioning of polynomial tasks: test generation, an example
Author :
Savir, Jacob ; Bardell, Paul H.
Author_Institution :
IBM, Poughkeepsie, NY, USA
Volume :
10
Issue :
11
fYear :
1991
fDate :
11/1/1991 12:00:00 AM
Firstpage :
1465
Lastpage :
1468
Abstract :
The circumstances under which a partitioning of a task with a polynomial complexity will result in an overall reduction of its execution time are analyzed. It is assumed that the task executor is sequential in nature, namely it can execute only one task at a time. Since partitioning of a task into smaller subtasks will, most probably, result in subtask overlap, there is a risk that a given partitioning scheme will yield an increase in its overall execution time. Formulas are derived to test the effectiveness of any proposed partitioning scheme. In the case of multiple partitioning options, the best one can be easily obtained. One of the possible tasks that this analysis is applicable to is the test generation of digital circuits with a uniprocessor
Keywords :
computational complexity; digital integrated circuits; integrated circuit testing; polynomials; digital circuits; execution time; partitioning; polynomial complexity; polynomial tasks; task executor; test generation; Aging; Circuit testing; Data systems; Digital circuits; Jacobian matrices; Manufacturing; Navigation; Partial differential equations; Polynomials; Space technology;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.97626
Filename :
97626
Link To Document :
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