High-resolution OCDR for testing integrated-optical waveguides: dispersion-corrupted experimental data corrected by a numerical algorithm

Author

Kohlhaas, Andreas ; FrÖmchen, Carsten ; Brinkmeyer, Ernst

Author_Institution

Tech. Univ. Hamburg, Germany

Volume

9

Issue

11

fYear

1991

fDate

11/1/1991 12:00:00 AM

Firstpage

1493

Lastpage

1502

Abstract

A numerical algorithm is presented and applied to dispersion-corrupted experimental data taken by coherence domain reflectometric (OCDR) measurements. It results in a retrieval of micrometer resolution and an enhanced dynamic range. High-resolution OCDR measurements may be seriously impaired by dispersion effects in the waveguides under test and rugged source spectra. In the investigation (Ti:LiNbO₃ single-mode waveguide, 16 mm long; superluminescent diode source at λ₀=820 nm) the spatial resolution progressively deteriorates along the waveguide by about one order of magnitude (from 6 to 60 μm). The algorithm was applied to the experimental data and successfully removed the dispersive broadening of the signatures

Keywords

integrated optics; optical dispersion; optical testing; optical waveguides; reflectometry; LiNbO₃:Ti single mode waveguide; dispersion-corrupted experimental data; dispersive broadening; enhanced dynamic range; integrated-optical waveguides; micrometer resolution; numerical algorithm; optical coherence domain reflectometry; signatures; spatial resolution; superluminescent diode source; Dispersion; Mirrors; Optical interferometry; Optical noise; Optical reflection; Optical sensors; Optical signal processing; Optical waveguides; Spatial resolution; Testing;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.97637

Filename

97637