• DocumentCode
    15592
  • Title

    Thermal Pathfinding for 3-D ICs

  • Author

    Priyadarshi, Shekhar ; Davis, William Rhett ; Steer, Michael B. ; Franzon, Paul D.

  • Author_Institution
    North Carolina State Univ., Raleigh, NC, USA
  • Volume
    4
  • Issue
    7
  • fYear
    2014
  • fDate
    Jul-14
  • Firstpage
    1159
  • Lastpage
    1168
  • Abstract
    System architects traditionally use high-level models of component blocks to predict trends for various design metrics. However, with continually increasing design complexity and a confusing array of manufacturing choices, system-level design decisions cannot be made without considering physical-level details. This effect is more pronounced for 3-D integrated circuits (ICs) because it provides a plethora of physical-level design choices, such as the number of stacking layers and the type of 3-D bonding method, along with the choices provided by 2-D ICs. Thus, it is necessary for system-level flows to predict the complex interactions among system performance, power, temperature, floorplanning, process technology, computer architecture, and software/workloads. This is often called pathfinding. This paper presents a pathfinding flow that integrates SystemC transaction-level electrical and dynamic thermal simulations. The goal of this flow is to pass complex physical constraints to system architects in a convenient form. The applicability of the proposed flow is shown using an example stacking of two processor cores and L2 cache in two-tier 3-D stack.
  • Keywords
    cache storage; integrated circuit bonding; integrated circuit layout; integrated circuit modelling; microprocessor chips; three-dimensional integrated circuits; 3D bonding method; 3D integrated circuits; L2 cache; SystemC; design complexity; floorplanning; physical level design; processor cores; stacking layers; system level design decisions; thermal pathfinding; two-tier 3D stack; Conductivity; Delays; Heating; Integrated circuit modeling; Materials; Solid modeling; Time-varying systems; 3-D IC; electronic system-level (ESL); electrothermal simulation; pathfinding; through-silicon via (TSV); transaction-level simulation; transaction-level simulation.;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2014.2321005
  • Filename
    6819421