Title :
Accuracy issues in surface resistance measurements of high temperature superconductors using dielectric resonators (corrected)
Author :
Mazierska, Jania ; Wilker, Charles
Author_Institution :
Dept. of Electr. & Comput. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia
fDate :
12/1/2001 12:00:00 AM
Abstract :
Reproducible and accurate measurements of the surface resistance of high temperature superconductors are essential for the development and commercialization of the next generation of high performance cryoelectronic systems. Dielectric resonators are the best, most accurate technique for this measurement and have been suggested for the international standard technique. This paper discusses trade-offs amongst the various types of dielectric resonators including choices of the dielectric rod, the metallic enclosure, the electrical measurements of Q-factor, resonant frequency and coupling coefficients, and other issues to ensure reproducible and accurate measurements
Keywords :
Q-factor; dielectric resonators; electric resistance measurement; high-temperature superconductors; measurement standards; microwave measurement; superconducting microwave devices; superconducting thin films; Q-factor; coupling coefficients; dielectric resonators; dielectric rod; electrical measurements; high performance cryoelectronic systems; high temperature superconductors; international standard technique; measurement standard; metallic enclosure; reproducible measurements; resonant frequency; superconducting films; surface resistance measurements; Commercialization; Dielectric measurements; Electric variables measurement; Electrical resistance measurement; Frequency measurement; High temperature superconductors; Measurement standards; Q factor; Resonant frequency; Surface resistance;
Journal_Title :
Applied Superconductivity, IEEE Transactions on