• DocumentCode
    1559481
  • Title

    A hierarchical model for object-oriented design quality assessment

  • Author

    Bansiya, Jagdish ; Davis, Carl G.

  • Author_Institution
    Dept. of Math. & Comput. Sci., California State Univ., Hayward, CA, USA
  • Volume
    28
  • Issue
    1
  • fYear
    2002
  • fDate
    1/1/2002 12:00:00 AM
  • Firstpage
    4
  • Lastpage
    17
  • Abstract
    The paper describes an improved hierarchical model for the assessment of high-level design quality attributes in object-oriented designs. In this model, structural and behavioral design properties of classes, objects, and their relationships are evaluated using a suite of object-oriented design metrics. This model relates design properties such as encapsulation, modularity, coupling, and cohesion to high-level quality attributes such as reusability, flexibility, and complexity using empirical and anecdotal information. The relationship or links from design properties to quality attributes are weighted in accordance with their influence and importance. The model is validated by using empirical and expert opinion to compare with the model results on several large commercial object-oriented systems. A key attribute of the model is that it can be easily modified to include different relationships and weights, thus providing a practical quality assessment tool adaptable to a variety of demands
  • Keywords
    data encapsulation; object-oriented programming; software metrics; software quality; behavioral design properties; cohesion; commercial object-oriented systems; coupling; design properties; encapsulation; expert opinion; hierarchical model; high-level design quality attributes; high-level quality attributes; modularity; object-oriented design metrics; object-oriented design quality assessment; product metrics; quality assessment tool; quality attributes; reusability; Object oriented modeling; Quality assessment;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/32.979986
  • Filename
    979986